PRINCIPAL FACTOR AND CLUSTER ANALYSIS FOR SEED YIELD AND BACTERIAL LEAF BLIGHT RESISTANCE IN ADVANCED F4 PROGENIES OF CLUSTERBEAN
ANIL, S.K. PAHUJA, S.P. KADIAN, R. YADAV AND NABIN BHUSAL
Forage Section,Department of Genetics & Plant Breeding,
CCS Haryana Agricultural University,Hisar(India)
(Received: 11 February 2014; Accepted: 28 March 2014)
Principal factor and hierarchical cluster analyses were carried out in 36 advance F4 progenies of cluster bean. The study was done on 11 traits, which identified five principal components explaining 78.93 per cent variability . The first PC explained 28.76 per cent of total variation. The second, third, fourth and fifth principal components explained 18.19, 11.83, 10.78 and 9.38 per cent variation, respectively. Using principle factor (PF) scores, all the progenies were plotted for PF I and PF III which cumulatively explained 40.59 per cent variability. Factor I was designated as yield factor and factor III was designated as bacterial leaf blight disease factor. The hierarchical cluster analysis (UPGMA with city block distances) classified these progenies into five clusters. Cluster II consisted of maximum number of progenies i.e. fifteen. Clusters I, III, IV and V included 12, 7, 1 and 1 progenies, respectively.
Key words : Principal factor, hierarchical analysis, principal components ,cluster bean.